QC Solutions, Inc. was founded in 1993 to develop and commercialize non-contact, non-destructive monitoring systems for silicon wafer manufacturers and the semiconductor industry.

Since that time, QCS has continued to develop and patent photovoltage measuring technology to meet the evolving needs of the semiconductor industry.

QCS is now a leading supplier of advanced epitaxial metrology and ion implantation wafer monitoring equipment for the semiconductor industry.

We design, manufacture and support fully programmable robotic, non-contact, non-destructive wafer mapping and point pattern sampling equipment.

• The ICT 300 is designed to monitor a long list of implant species over a remarkable range of energy and dose with exceptional sensitivity.
• The 7000 Series is designed to monitor n or p-type epitaxial wafer with demonstrated reliability and repeatability.

Using these real time, in line monitoring tools enables early process problem identification and reduces potential down stream cost.

For additional information, please click on Technology at the top of the screen.