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Semiconductor Metrology Solutions for Ion Implant and Epi Wafers


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QC Solutions has moved!

From March 1st 2008, we are now located at our new offices. See the contact page for our new address.

QC Solutions designs and builds advanced non-contact, non-destructive metrology systems to improve semiconductor chip fab yields and reduce costs.

The ICT 300 ion implant characterization tool provides in-line monitoring with dramatic improvements in speed, sensitivity, reliability and repeatability.

The 7000 Series epi monitoring tools provide epi manufacturers with a non-destructive, accurate, and repeatable epitaxial dopant monitoring tool.

[ICT300] [Software display] [7300UV2]

ICT300

7300RC

[Color and contour maps]

The flexible, intuitive GUI interface includes statistical, comparative & diagnostic tools

[Color maps]

Ion Wafers - Color & Contour Maps

Epi Wafers - Color Maps