QC Solutions designs and builds advanced non-contact, non-destructive metrology systems to improve semiconductor chip fab yields and reduce costs.

The ICT 300 ion implant characterization tool provides in-line monitoring with dramatic improvements in speed, sensitivity, reliability and repeatability.

The 7000 Series epi monitoring tools provide epi manufacturers with a non-destructive, accurate, and repeatable epitaxial dopant monitoring tool.

ICT300		7300RC
	The flexible, intuitive GUI interface includes statistical, comparative & diagnostic tools
Ion Wafers - Color & Contour Maps		Epi Wafers - Color Maps