QC Solutions merges with Semilab!
As of March 30, 2009 QC Solutions has been acquired by Semilab, Hungary. See the press release for full details.
QC Solutions designs and builds advanced non-contact, non-destructive metrology systems to improve semiconductor chip fab yields and reduce costs.
The ICT 300 ion implant characterization tool provides in-line monitoring with dramatic improvements in speed, sensitivity, reliability and repeatability.
The 7000 Series epi monitoring tools provide epi manufacturers with a non-destructive, accurate, and repeatable epitaxial dopant monitoring tool.
|
|
|
|
ICT300 |
7300RC |
|
|
The flexible, intuitive GUI interface includes statistical, comparative & diagnostic tools |
|
|
Ion Wafers - Color & Contour Maps |
Epi Wafers - Color Maps |